The design and manufacturing of IC is a complex process. Every detail from design to manufacturing is crucial. Even a small error can lead to chip failure, affecting the quality and yield of the final product.
The key to improving yield is to monitor and detect the manufacturing process. By incorporating other data from the manufacturing process for fast and accurate analysis, problems and potential risks can be identified. The data is then fed back to both foundries and fabless companies to improve processes and designs.
Semitronix focuses on electrical testing technology and has developed a series of software, hardware, and services to help determine the optimal manufacturing processes and identify factors that affect product yield.
Due to the complexity of chip structures, conducting electrical tests directly on the product chips often proves to be inefficient. In the industry, it is common practice to use test chips as substitutes for product chips in conducting electrical tests. Test chips are manufactured using the same processes as product chips and can be integrated on the same wafer. The test results obtained from these chips can reflect the characteristics of key devices in the product chips and assess the risk levels associated with the manufacturing process.